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MPI TS50 manual probe system

MPI TS50 Manual Probe Station

MPI TS50 | 50 mm Manual Probe System For accurate and reliable DC/CV and RF measurements

The MPI TS50 manual probe system has been specifically designed for IC Engineering, Single Die probing and academic use in DC/CV and RF measurement applications. The TS50 with the small footprint (300 x 300 mm) is engineered to its simplest form to allow convenient operation and providing quick set-up without compromising functionality and measurement capability.

Flexible Platform

  • Designed for research, development and academic use in IC engineering, single die probing
  • Ideal platform for load pull and high frequency noise measurement

Ergonomic Design

  • Solid and stable platform in small footprint (300 x 300 mm) design
  • Rigid platen accommodates up to 6 DC or 2 RF positioners • Simple operation for stage and microscope positioning

Microscope and Optics Options

  • Various optics options available
  • Stereo MPI ST45 or single tube MPI SZ10 with up to 10x zoom and 95 mm working distance
  • HDMI cameras, monitor user interface without computer

Microscope Mount and Movement

  • Stable bridge for high quality optics
  • Microscope pivot XY movement
  • 50 mm linear Z with the focus block

Adjustable Platen Height

  • Micrometer control for precise adjustment
  • 25 mm range for various applications

Probe Platen

  • Stable and rigid design
  • Supports DC/CV and RF measurements
  • Rectangular adjustments for RF positioners

Ultra Small Footprint

  • 300 x 300 mm base plate designed for bench top use
  • Comes with vibration absorber base
  • Low profile design for maximum usability
  • Ideal for load pull applications 

RF Calibration

  • Auxiliary chuck for calibration substrates
  • Built-in ceramic for accurate calibration
  • 1 µm flatness for consistent contact quality

Modular Chucks

  • Non-thermal chucks
  • Supports DC/CV and RF applications

DC and RF Positioners

  • Supports 2-port RF and up to 6 DC positioners
  • Wide range of positioners available
  • Dedicated probe arms for DC/CV and RF measurements

Chuck XY-Theta Stage Movement

  • 100 x 75 mm XY movement
  • Including 25 x 25 mm fine micrometer control
  • ±5° Theta fine adjustment
  • Quick release function
  • Independent fast XY navigation

Front Mounted Vacuum Control

  • Easy access
  • Clearly marked

Upgradability

  • Available with various chuck options and wide range of accessories such as DC/RF/mmW MicroPositioners, Optics, microscopes and EMI shielded dark box to support various application requirements

*Available Options

  • Vibration isolation platform
  • EMI-shielded DarkBox
  • Vacuum pump
  • Table with integrated rack for thermal controller, computer and keyboard push tray
  • Dual monitor stand option
  • Instrument shelf option
Features
  • Designed for research, development and academic use in IC engineering, single die probing
  • Microscope pivot XY movement
  • Supports DC/CV and RF measurements
  • 300 x 300 mm base plate designed for bench top use
  • Supports 2-port RF and up to 6 DC positioners
  • Dedicated probe arms for DC/CV and RF measurements
  • Including 25 x 25 mm fine micrometer control
  • Auxiliary chuck for calibration substrates
BrandMPI Corporation

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