The load board used to interface the device under test (DUT) to the instruments in the TS-900 Semiconductor Test System is a critical component in the overall test system performance. The careful consideration of its design will allow consistent and repeatable test results increasing first pass yields and minimizing false failures, reducing the need for retesting failed devices and increasing test throughput.
Designing the load board might look like a routine task that can be accomplished easily, however with new technologies and increasingly complex devices to be tested, there are many more issues to be considered when developing the design.
Some factors need to be considered early are board layout, parts placement, power planes and grounding. These factors all help minimize crosstalk, noise and current leakage issue and improve the electrical, signal performance and integrity…Know More