Recent advancements in PXI (Compact PCI Extensions for Instrumentation) digital, analog and RF test products and systems now makes it possible for test engineers to address a range of ATE device test needs with the PXI platform. In particular, PXI digital products that offer tester per-pin features including a parametric measurement unit (PMU) per-pin architecture as well as PXI test systems that incorporate these features are now offering ATE semiconductor test capabilities with high value and performance. In addition, these PXI test systems, such as Marvin Test Solutions’ TS-900 are providing test engineers cost-effective ATE that can be used for failure analysis, prototype device verification, and pilot / early production runs – allowing the “big iron” ATE to be focused on the volume production test applications while providing engineering test groups ATE features in a compact and configurable platform.

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