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The MPI Advanced Semiconductor Test Division is providing a wide range of engineering probe systems for

The MPI Advanced Semiconductor Test Division is providing a wide range of engineering probe systems for Device Characterization for modeling, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well special requirements for MEMS, High Power, RF and mmW device testing.

MPI Advanced Semiconductor Test Division’s ability to understand customer and market requirements FAST and having the talent to turn those learnings into INNOVATIVE, never seen before Engineering Probe Systems, are the key differentiators to other products on the market.

As technology and innovation leaders MPI Engineering Probe Systems are pioneering in many areas with features only found on Advanced Semiconductor Test Division products.

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